CoorsTek’ high-purity graphite products, which have unique properties compared with metal materials and other ceramic materials, are used in a variety of industries, including semiconductors. In particular, our high-purity graphite materials, which contain less than 3 ppm of ash, are widely used in heaters and crucibles for pulling single crystal silicon and boats for liquid-phase epitaxial growth in the semiconductor manufacturing processes. In addition, CLEAR CARBON, composed of an SiC film coated on a high-purity graphite substrate, has earned a reputation for excellent quality worldwide as susceptors for epitaxial growth and other jigs.
SiC anchored deeply in the surface layer of graphite substrate; it provides CLEAR CARBONwith strong adhesion of SiC to Graphite substrate
Product name | Gas | Process temperature () | |||||
---|---|---|---|---|---|---|---|
1300 | 1350 | 1400 | 1450 | 1500 | 1550 | ||
CLEAR CARBON | H2 | ||||||
H2+HCI | |||||||
Conventional CVD-Sic coating | H2 | ||||||
H2+HCI |
Normal surface (non surface finish)
Surface finish 1
Surface finish 2
CLEAR CARBON is used in wide range of semiconductor manufacturing processes,
e.g., Epitaxial growth, MO-CVD, etc.
SiC coating film | |
---|---|
Structure | -SiC |
Bulk Density | 3.2 |
Bending Strength | 500MPa |
Thermal conductivity | 200W/mK |
Emissivity (650) | 76% |
Coefficient of Thermal (25-1200) | 4.410-6/ |
Graphite Substrate (AP70) | |
---|---|
Bulk Density | 1.88g/cm3 |
Open Porosity | 10% |
Shore Hardness | 60 |
Specific Resistance | 11 |
Bending Strength | 45MPa |
Young's Modulus | 13.5GPa |
Thermal Conductivity | 107W/mK |
Coefficient of Thermal Expansion | 4.810-6/K |
Accelerated test for oxidation rate (Typical data)
Graphite Substrate (AP70) | |
---|---|
Bulk Density | 1.88g/cm3 |
Open Porosity | 10% |
Shore Hardness | 60 |
Specific Resistance | 11 |
Bending Strength | 45MPa |
Young's Modulus | 13.5GPa |
Thermal Conductivity | 107W/mK |
Coefficient of Thermal Expansion (0-450) | 4.810-6/K |